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測驗學刊 TSSCI

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篇名 中學電機電子技術性向測驗量表之編製
卷期 56:1
並列篇名 The Construction of the Electronic and Electric Technology Aptitude Test Battery for High School Students
作者 徐昊杲賴慕回陳德貴詹博元張天民
頁次 49-68
關鍵字 電機電子技術性向測驗Aptitude TestElectronic and Electric TechnologyTSSCI
出刊日期 200903

中文摘要

本測驗為一特殊性向測驗,包括電機電子基本知能、電機電子物理知能、電機電子數學邏輯知能等三個分測驗,經預試後勘定適切之題目各 42 題,作為正式測驗題本。本測驗編製適用對象為國三、高中(職)一、二年級學生,目的在測量學生電機電子技術性向,以提供教育及職業輔導之參用。
正式測驗題本完成後,為建立常模,由北、中、南、東四區隨機叢集抽樣國民中學14所、高中11所及高職13所進行正式施測,有效樣本為1,296人。在信度考驗方面,本測驗採用庫李信度(KR#20)與再測信度進行考驗;在效度考驗方面,以本測驗分數和其學業成績的相關、各分測驗採各測驗分數間的相關,以及年級間和性別間的分數差異分析來進行效度研究。總之,本研究發展之「電機電子技術性向測驗量表」符合特殊性向測驗評量之趨勢,且能涵蓋電機電子領域所應包含之「技術性」,是一份具有良好信度與效度的測驗量表。

英文摘要

The Electronic and Electric (abbreviate as E & E) Technology Aptitude Test inclu-des 3 subtests: Basic E & E knowledge scale, Physics of E & E scale, Mathematical Lo-gic of E & E scale. After pretest, 42 questions are selected to a formal test. The aim of this test is to measure the technology aptitude in Electronic and Electric and provide for education and vocational guidance. This test is used to the students from the 9th grade to 11th grade.
Fourteen junior high schools, eleven senior high schools and thirteen vocational high schools from each four areas in Taiwan are selected as random and cluster samp-ling. For the aspect of reliability, the KR#20 and test-retest reliability is adopted in the test. Validity is concerned according to three perspectives: the relation between the grades of the aptitude test and academic tests, the internal consistency of each test, and the difference between age and sex. The Technology Aptitude Test is not only accord the currency of aptitude but consists the technique of E & E.

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