掃描電子顯微／X 射線能譜分析法是發展成熟的分析方法，可同時觀察微量物證的顯微形態特徵並進行非破壞性的多元素分析，使其在鑑識科學廣被應用。本文介紹其在射擊殘跡、火工品爆燃殘跡、射擊後彈頭微物、電焊殘跡、砂輪機殘跡與打火機殘跡等微量證物鑑定上之應用。

Scanning electron microscopy/energy dispersive X-ray spectrometry (SEM/EDS) is a well developed analyticalmethod. SEM/EDS᾿s capability to simultaneously perform morphological and multi-elemental analysis of traceevidence leads to its extensive application in forensic examination of physical evidence. Herein, we brieflydescribed application cases such as gunshot residues, pyrotechnics deflagration residues, trace evidence on firedbullets, stick welding residues, disc grinder residues, and lighter fl int residues by SEM/EDS forensic examination.