條紋分析法在光學檢測中是一門重要的檢測技術，透過光學檢測方法能獲得高品質的光學元件。光學檢測
中利用擷取到的干涉圖來分析，並藉此提升光學元件品質，但常會有混合條紋影響到干涉圖形。在本文中，我們透過傾斜像差來模擬混合條紋的影響，並使用幾個去混合條紋雜訊的方法來還原原始條紋及重建其光程差。將雜訊干涉圖形使用整體經驗模態分解法來分解並得到本質模態函數，接著將特定的本質模態函數移除，來降低混合條紋雜訊的影響。經過處理的雜訊干涉圖形，將可以輕易地利用條紋分析法來重建原始條紋的光程差。將模擬的混合條紋雜訊干涉圖形經由整體經驗模態分解法來降低其混合條紋雜訊後，重建的光程差與原始條紋的光程差均方根值相差 0.081 個波長。在實驗中，整體經驗模態分解法在處理較直的干涉條紋時能有較佳的分解能力，但對於較彎曲的干涉條紋，則不易將雜訊與原始訊號分離。

Fringe analysis is an important technique in optical testing, and optical testing can bring high quality and high
precise optics. In the optical lens measuring, the fringe of the optical lens is analyzed as the interferometer
acquiring the interferogram and the infl uence of the mixing fringe usually affects the interferogram. In this paper,
the mixed image is simulated by the tilt aberration, and several methods of the reducing mixing fringe are utilized
to reconstruct the optical paths difference (OPD) profile of the mixed image. The ensemble empirical mode
decomposition (EEMD) method is used to decompose the mixed image into several intrinsic mode functions
(IMFs), and then removing one or more IMFs to reduce the infl uence of the mixing fringe in the mixed image. After
the procedure of reducing infl uence of the mixing fringe, the noisy fringe can reconstruct the OPD profi le easily.
Using EEMD method to reduce the infl uence of the mixing fringe in the simulation, the root mean square (RMS)
value of the OPD is 0.081 waves as the residue image subtracted from the OPD profi les of original image. In the
experiment, the EEMD method reducing the noise of the mixing fringe has the advantage on the straighter fringe,
but the crooked fringe is diffi cult to be separated from the noisy interferogram after the procedure of the EEMD.