結合多孔性整體式聚合物（Poly (GMA-co-EDMA) monolith）與高穩定度金奈米粒子（Au NPs）之低成本塑膠基底分析元件在本研究中被證實，並進一步達到低濃度汞離子濃縮偵測之目的。元件製造首先利用光聚合方式將多孔性整體式聚合物in situ 聚合於微流道中，並藉由cysteamine 此親核溶液，打開整體式聚合物表面之oxirane 部分，提高整體式聚合物表面之硫醇基團含量，使得金奈米粒子由共價鍵結附著於聚合物表面。應用此元件於汞離子濃縮偵測部分，使用≤ 2 ppb 之低濃度汞離子溶液，將溶液導入至流道經由金奈米粒子吸附濃縮後，使用酸性溶液將汞離子脫附，並連結電感耦合等離子體質譜（ICP-MS）檢測汞離子濃度，結果證實偵測到之汞離子濃度可有效提高至5 倍以上。

Porous Polymer Monoliths (Poly GMA-co-EDMA monolith) combined with high stability, low-cost gold nanoparticles (Au NPS) of the plastic analytical substrates element is confirmed in this study and further to achieve the purpose of detecting low concentration of ionic mercury. A thermoplastic device is assembled in situ by attaching Au NPs onto photopolymerized poly (GMA-co-EDMA) monoliths. Cysteamine is then selected to create oxirane rings, which enables the development of monoliths with a higher density of thiol groups, generating a higher affinity between Au NPs and thiol ligands. Next,low concentration mercury solutions of less than 2 ppb are inspected within the channel of the formation of Au-Hg amalgams. After elution, inductively coupled plasma mass spectroscopy (ICP-MS) is used to detect the mercury ions with the result of concentration up to five times by using this platform.