在高良率製程工業的迅速發展之下，對於產品不良率的嚴格要求，高良率製程的不良率非常低，品質特性已不符合近似常態分配假設。因此無法使用傳統的p管制圖與np管制圖來監控製程不良率，若仍然使用傳統的管制圖監控製程，將會造成錯誤警訊的增加。累計計數和（Cumulative Count of Conforming，CCC） 管制圖與CCC-r管制圖已被提出能夠有效的監控高良率製程的不良率。另外，當品質特性呈現不對稱分配、品質成本不對稱、或是單方向的製程偏移較為重視的時候，單邊管制圖的設計會比雙邊管制圖較為合適。因此，本研究將建構單邊CCC 管制圖和單邊CCC-r管制圖，推導管制界限，並探討平均連串長度及其變異性，予以探討管制的績效。研究結果發現，單邊CCC管制圖與單邊CCC-r管制圖在偵測製程不良率偏移時，有良好的表現。

In statistical process control, p-chart is usually for monitoring the fraction nonconforming. The control limits of p-chart are obtained based on Normality assumption. Normality assumption will be violated for very low fraction nonconforming in high yield processes. The cumulative counts of conforming chart (CCC chart) and CCC-r chart have been shown to be useful for monitoring high yield processes. When the quality characteristic is asymmetric and the one direction shifting is of interested, a one-sided control chart would be more appropriate than a two-sided chart. Thus, we construct one-sided CCC chart and one-sided CCC-r chart in this study. The average run length and its variability are also investigated. The results show that the proposed control charts have good performance for detecting shifts in fraction nonconforming.