場感測探針顯微術是研究奈微米材料的重要手段，其探針針尖修飾更直接決定了場感測能力。在另一技術領域，專利分析與技術探勘是研發初期不可或缺的利器。從各技術領域的專利數目，可以窺見該領域發展的成熟度；從專利訴訟案件中，更可窺見各專利權人於其所屬技術領域中影響力的消長。本論文除了技術介紹外，更聚焦在應用於場感測顯微術之金屬針尖修飾技術的美國專利。研究範圍涵蓋 1990 年至 2012年的美國專利公開案與獲證案，並透過專利管理圖、生命週期圖、專利地圖等方法分析此技術領域現有的重要發明人、所有權人及布局策略，最後對於此技術的未來發展方向提出建議。

Field sensitive scanning probe microscopy (FS-SPM) is a crucial approach in the study of micro-nano materials. Also, the modification of the tip apexes in FS-SPM directly determines the capability of field- sensing. In another fi eld of technology, patent analysis and technology mining are powerful tools in early-stage research and development activities. The maturity of any specifi c technological fi eld can be assessed by the number of patents; the change of impact from patent holders can also be evaluated from patent litigations. In this study, we focus on the recent development of metal tip modifi cation of FS-SPM. The scope of this research covers early publication of patents and issued patents from 1990 to 2012 in the United States. Patent management plots, life cycle analysis, patent maps are utilized to identify important inventors, patentees, and trends. Finally, we proposed several suggestions to the future development of this technology.