本研究探討以飛秒雷射(femtosecond laser)一步驟於無還原劑的氧化石墨烯(graphene oxide, GO)水溶液中直接將GO還原形成還原態石墨烯(reduced graphene oxide, RGO)。再分別利用紫外光可見光分光光譜儀(UV/vis spectrophotometer, UV/vis)、顯微拉曼光譜儀(micro-Raman spectrometer)、X光繞射分析儀(X-ray diffractometry, XRD)、X光光電子能譜儀(X-ray photoelectron spectroscopy, XPS)和原子力顯微鏡(atomic force microscopy, AFM)探討GO和RGO還原前後的結構組成、元素分析和表面形貌變化。最後以飛秒雷射製備的RGO與熱還原法和化學還原法製備的RGO進行比較，證實經飛秒雷射能有效還原GO。

In this paper, a femtosecond laser was used to reduce GO to RGO in an aqueous solution without using reducing agents. The method of preparation of RGO was characterized by UV/vis spectrophotometer (UV/vis), micro-Raman spectrometer, X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM). Compared with chemically reduced graphene oxide and thermally reduced graphene oxide, the reduced graphene oxide prepared by the femtosecond laser showed excellent properties.