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技術學刊 EIScopus

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篇名 ONE-DIMENSIONAL SURFACE PROFILOMETER BASED ON THE HETERODYNE ANGLE DEVIATION INTERFEROMETRY
卷期 32:3
作者 Ming-Hung ChiuPei-Wei Gao
頁次 197-204
關鍵字 first-order opticsheterodyne interferometrysurface plasmon resonanceheight measurementsEIScopusTSCI
出刊日期 201709

中文摘要

英文摘要

We propose heterodyne angle deviation interferometry (HADI) to measure the surface profile in real time. A beam incident into a lens’ marginal and reflected from a sample and then finally passing through to the lens is parallel to the optic axis when the sample is just located on the focal plane. When the sample’s surface departs from the focal plane, the reflection beam deviates a small angle from the optic axis which is proportional to the defocus length. We use the common-path heterodyne interferometer (CPHI) with a surface plasmon resonance (SPR) angular sensor to measure the deviation angle by the phase presentation. From the phase difference to surface height transformation and scanning the surface, the one-dimensional surface profile is plotted. The measurable range is of +-2.5 mm with the lateral resolution of 10 um and the best vertical resolution is of 12 nm.

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