光致衰退 (light-induced degradation, LID) 是一種廣泛存在於工業用 (單及多晶) 矽太陽能電池片上，經由照 光或是施加正向電壓後，進而導致電池片效能衰退的現象。衰退的現象源自於複合中心 (缺陷) 的生成， 有效監控 LID 的程度對工業界來說是必要的。然而，目前針對電池片做 LID 測試的標準程序尚未建立， 此外，傳統 LID 測試的衰退源－光的硬體保養並不容易。為此，我們訂定以發展出一台可以提供可靠， 快速的工業用 LID 測試機台做為目標。本文即針對機台研發的過程及其在工業上的應用作介紹。

Light-induced degradation (LID) is a well-known problem of industrial silicon solar cells and can lead to severe electrical performance loss through the formation of recombination-active defects during the excess carrier injection by illumination or forward biasing. Thereby an effective LID inspection for industry is essential. Unfortunately, a standard LID test procedure based on the solar cell level is currently missing. Moreover, the maintenance of the traditional degradation source - light is challenging. In order to solve these concerns, our goal of this work is to develop a reliable and rapid LID test procedure upon a customer friendly LID test machine. This article introduces the development process of the machine and its industrial applications.