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篇名 三維結構光量測方法與應用之回顧
卷期 226
並列篇名 A Review of 3D Structured Light Measurement Methods and Applications
作者 張毓紋
頁次 007-023
出刊日期 202103

中文摘要

傳統二維影像技術已經不敷現今的市場需求,多了一項深度資訊的三維量測技術因此興起,其中結構光技術具有高解析度與高精度的優點,應用廣泛。本文首先介紹三種常見的非接觸式三維形貌量測方法,並說明結構光三維量測技術的工作原理與校正方法之演變。接著將結構光編碼方法與編碼圖案依分類來比較其優缺點,再列舉結構光三維量測技術在各種領域中的應用。最後討論一些目前三維量測技術的技術障礙與挑戰,並提出潛在應用與未來方向,以了解其發展性。

英文摘要

Traditional 2D image techniques are insufficient for market demand, and 3D measurement techniques, which owns the depth information, are rising. Among 3D measurement techniques, structured light method is widely applied due to its high resolution and high accuracy. In this article, first, three common 3D non-contact shape measurement techniques will be introduced, and the principle and the calibration of structured light method will be explained. Next, the coding methods and patterns will be classified and compared by their characters, and some examples of applications in different fields will be listed. Finally, present challenges and improvements of 3D measurement techniques will be discussed to understand its future development.

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