本研究是以CCD 攝影機為基礎的量測系統結合機械視覺技術來發展一套可以自動作QFN (Quad Flat No leads) IC 的外觀尺寸的量測系統，量測的項目包括QFN IC 長度、寬度、腳間寬及 計算其偏差位移值(Offset)等項目。為了提高量測的精準度，本研究使用次像素的技術來減少量 測誤差。經實驗證實本研究開發的QFN 自動量測系統可達到高精確度及穩定性的目標，且能符 合產業界品管精度的要求。

The purpose of the research is to develop a full measurement system of QFN (Quad Flat No leads) IC components by combining CCD and the machine vision technology. The inspection items include the scales and offsets in length and width of QFN, and the pitch of pin. It is hope to help the industry to improve the problem in the quality control of QFN inspection. In order to improve the precision of measurement and meet the demands of industry, the subpixel technology is used in the research. Experiments demonstrate that the research of the automatic measurement system for QFN measurement will reach the target of the high precision and stability.